Table 1: Characteristics of the Weibull plots of various reliability tests (Au and PdCu wires used in 110 nm device).

Wire type Test type Test conditions (hr)   (η) PdCu HAST (3.6 V Bias) 130°C, 85% RH 1817 3593 3849 5.06 Au HAST (3.6 V Bias) 130°C, 85% RH 1553 2584 2752 4.96 PdCu UHAST (Unbiased) 130°C, 85% RH 3000 8971 10124 3.44 Au UHAST (Unbiased) 130°C, 85% RH 4000 9222 10189 2.82 PdCu TC −40°C to 150°C 7000 12544 13301 5.79 Au TC −40°C to 150°C 6000 11982 12922 4.72 PdCu HTSL 150°C, 175°C, 200°C N/A N/A N/A N/A Au HTSL 150°C, 175°C, 200°C N/A N/A N/A N/A