Table 1: Characteristics of the Weibull plots of various reliability tests (Au and PdCu wires used in 110 nm device).

Wire typeTest typeTest conditions (hr)
(η)

PdCuHAST (3.6 V Bias)130°C, 85% RH1817359338495.06
AuHAST (3.6 V Bias)130°C, 85% RH1553258427524.96
PdCuUHAST (Unbiased)130°C, 85% RH30008971101243.44
AuUHAST (Unbiased)130°C, 85% RH40009222101892.82
PdCuTC−40°C to 150°C700012544133015.79
AuTC−40°C to 150°C600011982129224.72
PdCuHTSL150°C, 175°C, 200°CN/AN/AN/AN/A
AuHTSL150°C, 175°C, 200°CN/AN/AN/AN/A