The Analytical Transmission Electron Microscopy: A Powerful Tool for the Investigation of Low-Dimensional Carbon Nanomaterials

Figure 13

(a) High resolution TEM image of a graphene flake compared to the area illuminated by the electron nanobeam shown in panel (b). (c)–(e) NED patterns of different regions of the flakes. Panel (c) is recorded from the area labeled as 1 in panel (a), while panel (d) from the region 2. Panel (e) corresponds to an area of the sample (not shown) having intermediate folding. Reprinted with permission from [64].