The Analytical Transmission Electron Microscopy: A Powerful Tool for the Investigation of Low-Dimensional Carbon Nanomaterials
Figure 14
(a) EELS spectra obtained from graphene flakes of different thicknesses and from graphite. In the inset, the -resonance peaks are blown up. (b) Energy shift of -resonance as a function of the relative thickness obtained from the EELS spectra with the log-ratio method. The number of layers (L) is estimated by calibrating the EELS thickness data to the results of electron diffraction, assuming a linear dependence of on the number of layers. Reprinted with permission from [64].
