All-Solution-Processed InGaO₃(ZnO)_m Thin Films with Layered Structure

Figure 4

XRD patterns of InGaZnO thin films (a)–(c) before and (d)–(f) after annealing on different buffer layers. (a) and (d) without ZnO buffer, (b) and (e) randomly oriented ZnO buffer layer, and (c) and (f) preferentially oriented ZnO buffer layer.