Journals
Publish with us
Publishing partnerships
About us
Blog
Journal of Nanomaterials
Journal overview
For authors
For reviewers
For editors
Table of Contents
Special Issues
Journal of Nanomaterials
/
2014
/
Article
/
Fig 2
/
Research Article
Novel BCD Process Platform with Integrated Self-Extracted JTE Trench Technology for EL Drivers ICs
Figure 2
SEM micrograph of SEJTET, PISO, and NSINKER testing structure.