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Journal of Nanomaterials
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2015
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Article
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Tab 2
/
Research Article
Focused Ion Beam Assisted Interface Detection for Fabricating Functional Plasmonic Nanostructures
Table 2
Material-dependent currents measured using the EPM for the same sample.
Beam current (nA)
Ion flux (ions cm
−2
s
−1
)
Material-dependent current (nA)
Ag oxide
Ag film
SiO
2
substrate
0.3
8.32 × 10
14
0.76
0.70
0.3
1.0
3.12 × 10
15
2.73
2.50
1.0