Strain Driven Phase Decomposition in Ion-Beam Sputtered Pr_1−XCa_XMnO₃ Films

Figure 3

X-ray diffraction pattern of PCMO films. (a) Detailed scans in the vicinity of the (004)/(220) reflection of 400 nm thick PMO films on STO prepared by Xe sputtering at different deposition temperatures. The vertical lines have been calculated from the bulk data in Table 2. (b) Overview: PCMO (, ) on SrTiO₃ (top) and MgO (bottom) prepared by Xe sputtering in the same run (samples F03_1a and F03_1b). The stars mark reflections which correspond to the respective substrate. This was confirmed by X-ray analysis of the noncoated substrate backsides. (c) Detailed scans in the vicinity of the (004)/(220) reflection. In addition, samples prepared by Ar sputtering ( and ) are also shown (D03_1a, D03_1b): the straight lines correspond to the bulk plane spacing of (left) and (right) for and 0.36. The plane spacings have been calculated from the bulk data in Table 2.

(a)

(b)

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