Strain Driven Phase Decomposition in Ion-Beam Sputtered Pr_1−XCa_XMnO₃ Films

Figure 4

Cross-sectional TEM analysis of PCMO thin films (). (a) PCMO () film on Pt-coated MgO (H05_1), bright-field image of an area with two twin domains (left) and a pronounced growth disturbance (right). (b) EDX element mapping of the same area. (c) Growth disturbance in an 110 nm thick PCMO film () on Nb-doped (0.1 wt.%) STO substrate (C03_1). (d) Surface precipitate on top of a 410 nm thick PMO () film on STO (A0_1). The sample was postannealed for 20 h at 900°C in air.

(a)

(b)

(c)

(d)