Effect of the Thickness of Insulator Polymeric Films on the Memory Behavior: The Case of the Polymethylmethacrylate and the Polystyrene
Figure 7
SEM images of (a) polymer layer and (b) the top aluminum electrode show no damage when cycles of 8 V were applied to the Al/PVA (10 nm)-PMMA (22 nm)/Al device. Contrary to the first case, when cycles of 20 V were applied, SEM images show physical damages in both, (c) the PMMA layer and the (d) top aluminum electrode. The inset of (c) shows the aluminum elemental mapping of the PMMA layer.
