Effect of Processing Parameters on Performance of Spray-Deposited Organic Thin-Film Transistors
Figure 3
SFM data of a spray-deposited diF-TES ADT, partially covering the interelectrode device region. (a) Topographic image, (b) topography derivative image, (c) phase shift image, (d) magnification topography taken on the dotted area in (a). (e) Line profile taken along the blue segment in (d) crossing three single steps and some one-layer-deep vacancy defects. (f) Height histogram of image (d).
