Flat-Top and Stacking-Fault-Free GaAs-Related Nanopillars Grown on Si Substrates
Figure 3
(a) SEM and (b)–(d) TEM images of the core-multishell GaP/GaAs/GaP nanowires. EDS mapping images are also included in (b). (a) Side view. (b)–(d) Sliced and thinned samples: (b) perpendicular to the axis; (c), and (d) along the axis.
