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Journal of Nanotechnology
Volume 2012 (2012), Article ID 971380, 15 pages
http://dx.doi.org/10.1155/2012/971380
Review Article

Surface-Enhanced Raman Scattering as an Emerging Characterization and Detection Technique

1Department of Genetics and Bioengineering, Yeditepe University, Atasehir, Kadıkoy, 34755 Istanbul, Turkey
2Department of Chemistry and Biochemistry, University of Maryland, Baltimore County, 1000 Hilltop Circle, Baltimore, MD 21250, USA
3Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA

Received 3 March 2012; Accepted 27 April 2012

Academic Editor: Simion Astilean

Copyright © 2012 Mustafa Culha et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Mustafa Culha, Brian Cullum, Nickolay Lavrik, and Charles K. Klutse, “Surface-Enhanced Raman Scattering as an Emerging Characterization and Detection Technique,” Journal of Nanotechnology, vol. 2012, Article ID 971380, 15 pages, 2012. doi:10.1155/2012/971380