- About this Journal
- Abstracting and Indexing
- Aims and Scope
- Annual Issues
- Article Processing Charges
- Articles in Press
- Author Guidelines
- Bibliographic Information
- Citations to this Journal
- Contact Information
- Editorial Board
- Editorial Workflow
- Free eTOC Alerts
- Publication Ethics
- Reviewers Acknowledgment
- Submit a Manuscript
- Subscription Information
- Table of Contents
Journal of Nanotechnology
Volume 2012 (2012), Article ID 971380, 15 pages
doi:10.1155/2012/971380
Surface-Enhanced Raman Scattering as an Emerging Characterization and Detection Technique
1Department of Genetics and Bioengineering, Yeditepe University, Atasehir, Kadıkoy, 34755 Istanbul, Turkey
2Department of Chemistry and Biochemistry, University of Maryland, Baltimore County, 1000 Hilltop Circle, Baltimore, MD 21250, USA
3Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
Received 3 March 2012; Accepted 27 April 2012
Academic Editor: Simion Astilean
Copyright © 2012 Mustafa Culha et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
How to Cite this Article
Mustafa Culha, Brian Cullum, Nickolay Lavrik, and Charles K. Klutse, “Surface-Enhanced Raman Scattering as an Emerging Characterization and Detection Technique,” Journal of Nanotechnology, vol. 2012, Article ID 971380, 15 pages, 2012. doi:10.1155/2012/971380