Review Article

Silicon Nanofabrication by Atomic Force Microscopy-Based Mechanical Processing

Figure 23

Surface morphology and I-V characteristics of areas processed at different loads and voltages of (closed circle) 80 nN, 0 V, (closed triangle) 0 nN, 2 V, and (closed square) 80 nN, 2 V.
102404.fig.0023a
(a)
102404.fig.0023b
(b)