Review Article

Silicon Nanofabrication by Atomic Force Microscopy-Based Mechanical Processing

Figure 24

Surface morphology and I-V characteristic of areas processed at different loads and voltages of (closed circle) 120 nN, 0 V, (closed triangle) 0 nN, 3 V, and (closed square) 120 nN, 3 V.
102404.fig.0024a
(a)
102404.fig.0024b
(b)