A Fourier Ellipsometer Using Rotating Polarizer and Analyzer at a Speed Ratio 1 : 1

Figure 2

Normalized calculated light intensity as a function of the rotation angle of the analyzer in the presence of c-Si and Au samples and in the straight through situation with no sample at 𝜆=632.8 nm and 𝜃₀=70^∘. The azimuth angles 𝜃, 𝜏, and 𝛿 are equal to zero.