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Journal of Sensors
Volume 2012 (2012), Article ID 961239, 8 pages
Modelling of Atomic Imaging and Evaporation in the Field Ion Microscope
School of Chemistry and CRANN, Trinity College Dublin, Dublin 2, Ireland
Received 15 June 2011; Revised 17 September 2011; Accepted 18 September 2011
Academic Editor: Sangmin Jeon
Copyright © 2012 Keith J. Fraser and John J. Boland. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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