- About this Journal ·
- Abstracting and Indexing ·
- Aims and Scope ·
- Article Processing Charges ·
- Articles in Press ·
- Author Guidelines ·
- Bibliographic Information ·
- Citations to this Journal ·
- Contact Information ·
- Editorial Board ·
- Editorial Workflow ·
- Free eTOC Alerts ·
- Publication Ethics ·
- Reviewers Acknowledgment ·
- Submit a Manuscript ·
- Subscription Information ·
- Table of Contents
Journal of Sensors
Volume 2012 (2012), Article ID 961239, 8 pages
Modelling of Atomic Imaging and Evaporation in the Field Ion Microscope
School of Chemistry and CRANN, Trinity College Dublin, Dublin 2, Ireland
Received 15 June 2011; Revised 17 September 2011; Accepted 18 September 2011
Academic Editor: Sangmin Jeon
Copyright © 2012 Keith J. Fraser and John J. Boland. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
- Y. Kuk and P. J. Silverman, “Role of tip structure in scanning tunneling microscopy,” Applied Physics Letters, vol. 48, no. 23, pp. 1597–1599, 1986.
- A. Fian and M. Leisch, “Study on tip-substrate interactions by STM and APFIM,” Ultramicroscopy, vol. 95, pp. 189–197, 2003.
- T. An, T. Eguchi, K. Akiyama, and Y. Hasegawa, “Atomically-resolved imaging by frequency-modulation atomic force microscopy using a quartz length-extension resonator,” Applied Physics Letters, vol. 87, no. 13, Article ID 133114, pp. 1–3, 2005.
- B. P. Geiser, D. J. Larson, S. S. A. Gerstl et al., “A system for simulation of tip evolution under field evaporation,” Microscopy and Microanalysis, vol. 15, supplement 2, pp. 302–303, 2009.
- E. A. Marquis, B. P. Geiser, T. J. Prosa, and D. J. Larson, “Evolution of tip shape during field evaporation of complex multilayer structures,” Journal of Microscopy, vol. 241, no. 3, pp. 225–233, 2011.
- F. Vurpillot, A. Bostel, and D. Blavette, “A new approach to the interpretation of atom probe field-ion microscopy images,” Ultramicroscopy, vol. 89, no. 1–3, pp. 137–144, 2001.
- R. G. Forbes, “Field evaporation theory: a review of basic ideas,” Applied Surface Science, vol. 87-88, pp. 1–11, 1995.
- M. K. Miller, A. Cerezo, M. G. Hetherington, and G. D. W. Smith, Atom Probe Field Ion Microscopy, Oxford Science Publications, 1996.
- H. J. Kreuzer and K. Nath, “Field evaporation,” Surface Science, vol. 183, no. 3, pp. 591–608, 1987.
- D. N. J. White, “A computationally efficient alternative to the Buckingham potential for molecular mechanics calculations,” Journal of Computer-Aided Molecular Design, vol. 11, no. 5, pp. 517–521, 1997.
- A. S. Lucier, H. Mortensen, Y. Sun, and P. Grütter, “Determination of the atomic structure of scanning probe microscopy tungsten tips by field ion microscopy,” Physical Review B, vol. 72, no. 23, Article ID 235420, pp. 1–9, 2005.
- G. Cross, A. Schirmeisen, A. Stalder, P. Grütter, M. Tschudy, and U. Dürig, “Adhesion interaction between atomically defined tip and sample,” Physical Review Letters, vol. 80, no. 21, pp. 4685–4688, 1998.
- T. V. de Bocarmé, T. D. Chau, and N. Kruse, “Imaging and probing catalytic surface reactions on the nanoscale: Field Ion Microscopy and atom-probe studies of O2–H2/Rh and NO–H2/Pt,” Topics in Catalysis, vol. 39, pp. 111–120, 2006.
- K. Motai, T. Hashizume, H. Lu, D. Jeon, T. Sakurai, and H. W. Pickering, “STM of the Cu(111)1 × 1 surface and its exposure to chlorine and sulfur,” Applied Surface Science, vol. 67, no. 1–4, pp. 246–251, 1993.
- F. Rahman, J. Onoda, K. Imaizumi, and S. Mizuno, “Field-assisted oxygen etching for sharp field-emission tip,” Surface Science, vol. 602, no. 12, pp. 2128–2134, 2008.
- H. W. Fink, “Mono-atomic tips for scanning tunneling microscopy,” IBM Journal of Research and Development, vol. 30, p. 460, 1986.