ZnO/ZnAl₂O₄ Nanocomposite Films Studied by X-Ray Diffraction, FTIR, and X-Ray Photoelectron Spectroscopy

Table 1

X-ray diffraction data for ZnO/ZnAl₂O₄ nanocomposite films (annealed at 700°C).

Pos. [°2Th.]	FWHM [°2Th.]	Identified planes ()	(Å)	Relative intensity (%)
31.3057	0.8839	220 ZnAl2O4	2.857	19.08
31.8155	0.1537	100 ZnO	2.813	31.48
34.5118	0.2024	002 ZnO	2.599	100.00
36.3725	0.2267	101 ZnO	2.470	53.29
36.8650	0.7104	311 ZnAl2O4	2.438	30.54
44.8092	0.6298	400 ZnAl2O4	2.023	2.24
47.6504	0.3149	102 ZnO	1.909	9.37
55.6419	0.6298	422 ZnAl2O4	1.652	3.65
56.7192	0.2362	110 ZnO	1.623	9.83
59.3661	0.6298	511 ZnAl2O4	1.557	6.27
62.9704	0.3149	103 ZnO	1.476	8.90
65.2577	0.4723	440 ZnAl2O4	1.430	9.10
68.0799	0.2880	112 ZnO	1.376	5.60