XPS, FTIR, EDX, and XRD Analysis of Al₂O₃ Scales Grown on PM2000 Alloy

Table 1

Composition and stoichiometry of the thin films obtained by statistical analysis of EDX spectrum.

Element	(keV)	Atom%, PM2000, 873 K	Atom%, PM2000, 1073 K	Atom%, PM2000, 1173 K	Atom%, PM2000, 1473 K
C K	0.277	4	5	2	<1
O K	0.525	15	38	55	59
Mg K	1.253	<1	<1	<1	5
Al K	1.486	11	21	34	34
Si K	1.739	<1	<1	0	0
Cr K	5.411	17	9	3	<1
Fe K	6.398	52	26	5	<1
Y L	1.922			<1	0
Zr L	2.042				0
Al/O ratio		0.709	0.560	0.618	0.578