A Novel SFP Extracting/Tracking Framework for Rigid Microstructure Measurement

<table>Comparing the accumulated error distribution curves of PS method and Similarity-PS method in the Mode 1. Points number from 0 to 250 are tracking points on the images which are captured under different illumination condition with the rest ones.</table>

Mathematical Problems in Engineering

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Figure 4

Figure 4: A Novel SFP Extracting/Tracking Framework for Rigid Microstructure Measurement 