Clustering Ensemble for Identifying Defective Wafer Bin Map in Semiconductor Manufacturing

Procedure 2

PSO clustering algorithm.

(1) Initialize each particle with cluster centroids.

(2) For iteration to do

  For each particle do

  For each data pattern

   calculate the Euclidean distance to all cluster centroids and assign pattern to cluster

    which has the minimum distance

  end for

   calculate the fitness function

  end for

   find the personal best and global best positions of each particle.

   update the cluster centroids by the update velocity equation (i) and update coordinate equation (ii).

        (i)

                        (ii)

  end for

(3) Step 2 is iterated until these is no data change