Clustering Ensemble for Identifying Defective Wafer Bin Map in Semiconductor Manufacturing

Table 2

Binary representation of clustering ensembles.

Clustering results
		1	1	1	0	0	0	0	0
		0	0	0	1	1	0	0	0
		0	0	0	0	0	1	1	1
		1	1	1	0	0	1	1	1
		0	0	0	1	1	0	0	0
		1	1	1	1	0	0	0	0
		0	0	0	0	1	1	1	1