Research Letters in Physics
Volume 2009 (2009), Article ID 382578, 4 pages
doi:10.1155/2009/382578
Research Letter

Effect of Sm Substitution on Structural, Dielectric, and Transport Properties of PZT Ceramics

Rajiv Ranjan,1 Rajiv Kumar,2 and R. N. P. Choudhary3

1Department of Physics, Jamshedpur Co-operative College, Jamshedpur 831036, India
2Department of Physics, Jamshedpur Worker's College, Jamshedpur 831012, India
3Department of Physics and Meteorology, Indian Institute of Technology Kharagpur (I.I.T KGP), Kharagpur 721302, India

Received 24 November 2008; Accepted 1 January 2009

Academic Editor: Lian Gao

Copyright © 2009 Rajiv Ranjan et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

The polycrystalline samples of Pb1−xSmx (Zr0.45Ti0.55)1−x/4O3 (PSZT) (where x  =  0.00,  0.03,  0.06, and 0.09) were prepared by a high-temperature solid-state reaction technique. Preliminary X-ray structural analysis of the materials at room temperature has confirmed their formation in single-phase with tetragonal crystal structure. The temperature dependence of dielectric response of the samples at selected frequencies has exhibited their phase transition well above the room temperature. The variation of ac conductivity with temperature and the value of activation energy reveal that their conduction process is of mixed type (i.e., singly ionized in ferroelectric region and doubly ionized in paraelectric phase).