Research Letters in Physics
Volume 2009 (2009), Article ID 594175, 4 pages
doi:10.1155/2009/594175
Research Letter

Evaluation of the Thickness in Nanolayers Using the Transfer Matrix Method for Modeling the Spectral Reflectivity

Juan E. González-Ramírez,1 Juan Fuentes,2 Luis C. Hernández,3 and Luís Hernández2

1Department of Physics and Mathematics, Autonomous University of Aguascalientes, Avenue Universidad # 940, Ciudad Universitaria, C. P. 20100 Aguascalientes, AGS, Mexico
2Department of General Physics, Faculty of Physics, University of Havana, 10400 La Habana, Cuba
3Institute of Sciences and Technology of the Materials, University of Havana, 10400 La Habana, Cuba

Received 3 December 2008; Accepted 13 February 2009

Academic Editor: Lian Gao

Copyright © 2009 Juan E. González-Ramírez et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Juan E. González-Ramírez, Juan Fuentes, Luis C. Hernández, and Luís Hernández, “Evaluation of the Thickness in Nanolayers Using the Transfer Matrix Method for Modeling the Spectral Reflectivity,” Research Letters in Physics, vol. 2009, Article ID 594175, 4 pages, 2009. doi:10.1155/2009/594175