Table 1:
Thickness evaluation using ellipsometry, RBS, TEM, and reflectivity spectra (present work) techniques.
Thickness measurement (nm)
(22 ± 4)*
23
**
(59 ± 5)*
60
†
(104 ± 6)*
125
‡
Z
n
𝑥
C
d
(
1
−
𝑥
)
Reflectivity;
**
Ellipsometry;
†
TEM;
‡
RBS.