]>Evaluation of the Thickness in Nanolayers Using the Transfer Matrix Method for Modeling the Spectral Reflectivity : Table 1
Table 1: Thickness evaluation using ellipsometry, RBS, TEM, and reflectivity spectra (present work) techniques.

Thickness measurement (nm)

(22 ± 4)*23**
(59 ± 5)*60
(104 ± 6)*125

Z n 𝑥 C d ( 1 𝑥 ) Reflectivity; **Ellipsometry; TEM; RBS.