Second-Order Nonlinear Optical Microscopy of a H–Si(111)1 × 1 Surface in Ultra-High Vacuum Conditions

Figure 3

SHG intensity images of a H–Si(111) surface after IR light pulse irradiation with scanning character patterns “𝑆” and “𝑇,” shown in (a) and (b), respectively. Scale bars are 200 μm.

(a)

(b)