Optical Second Harmonic Generation Microscopy as a Tool of Material Diagnosis

Figure 3

Simulated SHG intensity as functions of the focus position and Δ𝑘. Here, the sample thickness is set as 𝐿=500 nm. SHG intensity from inside of a sample is almost null in the case of Δ𝑘>0. For Δ𝑘<0, SH waves are generated also from inside of the sample [19].