Research Article

An Improved Bidirectional Shift-Based Reversible Data Hiding Scheme Using Double-Way Prediction Strategy

Table 1

Notations of the proposed method (all variables marked with a star are used in embedding process 2).

PEH: prediction-error histogram
PE: prediction error
S: secret information in binary bits with elements s1, s2, si, …, , …, sj, …, , …, sL, where L is the length of S
TH, : [−TH, TH], [] are the ranges of peak bins
PK, : the quantity of peak bin values
PKl, : double the number of peak bins
I, I (i, j): an 8 bit grayscale cover image with a size of H × W (H is the height and W is the width), I (i, j) is a pixel of I in row number i and column number j
I1, I1 (i, j): the first-stage stego image and one of its pixels
, : the final stego image and one of its pixels
P (i, j), : prediction value of I (i, j), I1 (i, j)
Pe (i, j), (i, j): prediction error of pixel I (i, j)
Pel (i, j), (i, j): prediction value of pixels I1r (i, j) and I1 (i, j) after left shifting
Per (i, j), (i, j): prediction value of pixels (i, j) and after right shifting
h (pe): the frequency of the prediction-error value pe in the histogram, where
I1r (i, j): the stego image after right shifting of PEH in embedding process 1
: the stego image after left shifting of PEH in embedding process 2
, : the quantity of units to move during expanding and shifting in right shift and left shift in embedding process 1
, : the quantity of units to move during expanding and shifting in left shift and right shift in embedding process 2
n, : the number of zero bins between the current positive bin value and the peak bins
m, : the number of zero bins between the current negative bin value and the peak bins