Enhanced DET-Based Fault Signature Analysis for Reliable Diagnosis of Single and Multiple-Combined Bearing Defects

<table class="table-group" id="tab1"><tr><td><table class="table"><tr><td class="thead-hr" colspan="2"><hr/></td></tr><tr><td align="left" rowspan="2">NEXUS conditioning amplifier (type 2692-C)</td><td align="left">(i) Frequency range: 0.1 Hz–100 kHz</td></tr><tr><td align="left">(ii) Sensitivity: 10 mV/ms<sup>−2</sup></td></tr><tr><td align="center" colspan="2"><hr/></td></tr><tr><td align="left" rowspan="2">Piezoelectric charge accelerometer (type 4371)</td><td align="left">(i) Frequency range: 0.1 Hz–12.6 kHz</td></tr><tr><td align="left">(ii) Sensitivity: 9.8 pC/g</td></tr><tr><td align="center" colspan="2"><hr/></td></tr><tr><td align="left">Portable data acquisition device (PULSE type 3560-C)</td><td align="left">Maximum sampling frequency: 25.6 kHz</td></tr><tr class="table-tr"><td colspan="2"><hr class="tbody-hr"/></td></tr></table></td></tr></table>

Summary of specifications of the data acquisition system.

Shock and Vibration

tab1

Table 1

Table 1: Enhanced DET-Based Fault Signature Analysis for Reliable Diagnosis of Single and Multiple-Combined Bearing Defects 