A Novel Prediction Method about Single Components of Analog Circuits Based on Complex Field Modeling

Table 1

Fitting formulas and effect of equations related to FI data sets.

FI	Degradation components	General formula	Coefficients (with 95% confidence bounds)	RMSE
1	𝑅1; (10 kΩ to 16 kΩ)	(14)	𝑎=0.01484 (0.01388, 0.0158); 𝑏=0.6866 (0.6748, 0.6984); 𝑐=−0.02625 (−0.02997, −0.02253)	0.003632
2	𝑅1; (10 kΩ to 4 kΩ)	(15)	𝑎=0.1746 (0.1721, 0.177); 𝑏=0.01529 (0.0152, 0.01538); 𝑐=−0.1806 (−0.1827, −0.1785); 𝑑=−0.01446 (−0.01528, −0.01364)	0.002864
3	𝑅3; (10 kΩ to 16 kΩ)	(14)	𝑎=0.01192 (0.01145, 0.01239); 𝑏=0.8539 (0.8465, 0.8613); 𝑐=−0.01988 (−0.02303, −0.01674)	0.004004
4	𝑅3; (10 kΩ to 4 kΩ)	(14)	𝑎=0.007 (0.006887, 0.007113); 𝑏=0.9976 (0.9945, 1.001); 𝑐=−0.00408 (−0.005341, −0.002819)	00.001902