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The Scientific World Journal
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2014
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Article
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Tab 2
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Research Article
Single-Event-Upset Sensitivity Analysis on Low-Swing Drivers
Table 2
improvement with current bias for different effective length at 0.5 GHz.
Leff (nm)
(fC) at
= 30 uA
(fC) at
= 500 uA
Increase in
L1 (90)
37.26
514.3
x13.79
L2 (99)
35.6
519.3
x14.59