Single-Event-Upset Sensitivity Analysis on Low-Swing Drivers

Table 2

𝑄_crit improvement with current bias for different effective length at 0.5 GHz.

Leff (nm)	𝑄crit (fC) at 𝐼bias = 30 uA	𝑄crit (fC) at 𝐼bias = 500 uA	Increase in 𝑄crit
L1 (90)	37.26	514.3	x13.79
L2 (99)	35.6	519.3	x14.59