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VLSI Design
Volume 8 (1998), Issue 1-4, Pages 337-341
http://dx.doi.org/10.1155/1998/34303

Numerical Evaluation of Iterative Schemes for Drift-diffusion Simulation

1Department of Electrical Engineering, Indian Institute of Technology at Kanpur, Kanpur 208016, U.P., India
2Beckman Institute, University of Illinois at Urbana-Champaign, 405 N. Mathews Avenue, Urbana 61801, IL, USA
3Department of Computer Science, University of Illinois at Urbana-Champaign, 1304 W. Springfield Avenue, Urbana 61801, IL, USA

Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

We introduce an iterative scheme to solve the drift-diffusion device simulation problem, which combines the Gummel iteration with the “pointwise iteration”, and then we compare its convergence behavior with other iteration strategies, for different test cases. Comparisons are made with the standard Gummel approach and a nonlinear multigrid iteration. The combined “Gummel-Pointwise” iteration has significantly better convergence characteristics than the Gummel iteration in all cases. The cost of the pointwise iteration varies only linearly with the number of grid points. While in terms of CPU time for the solution the pointwise iteration is not always faster in 2-D, in 3-D the combined technique becomes more and more advantageous as the grid size increases. It is found that the nonlinear multigrid scheme is overall not as effective as the combined iteration.