VLSI Design
Volume 7 (1998), Issue 2, Pages 191-201
doi:10.1155/1998/45472

Syndrome Signature in Output Compaction for VLSI Built-in Self-Test

Sunil R. Das,1,2 Nita Goel,2 Wen B. Jone,3 and Amiya R. Nayak4

1Presently with Dept. of Electrical Engineering and Computer Sciences, Computer Science Division, University of California, Berkeley 94720, CA, USA
2Dept. of Electrical Engineering, Faculty of Engineering, University of Ottawa, Ottawa KIN 6N5, Ontario, Canada
3Dept. of Computer Science and Information Engineering, National Chung Cheng University, Taiwan, Chiayi 62107, China
4School of Computer Science, Carleton University, Ottawa KIS 5B6, Ontario, Canada

Received 10 June 1997

Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Sunil R. Das, Nita Goel, Wen B. Jone, and Amiya R. Nayak, “Syndrome Signature in Output Compaction for VLSI Built-in Self-Test,” VLSI Design, vol. 7, no. 2, pp. 191-201, 1998. doi:10.1155/1998/45472