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VLSI Design
Volume 10 (2000), Issue 3, Pages 321-333
http://dx.doi.org/10.1155/2000/79281

Testing and Diagnosing Dynamic Reconfigurable FPGA

1Lab. for Reliable Computing (Rm. 807), Department of Electrical Engineering, National Tsing Hua University, 101, Sec. 2, Kuang Fu Rd., Taiwan, Hsinchu 30013, China
2Department of Electrical and Computer Engineering, University of California, Santa Barbara 93106, CA, USA

Received 1 February 1999; Accepted 1 October 1999

Copyright © 2000 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Dynamic reconfigurable field-programmable logic arrays (FPGAs) are receiving notable attention because of their much shorter reconfiguration time as compared with traditional FPGAs. The short reconfiguration time is vital to applications such as reconfigurable computing and emulation. We show in this paper that testing and diagnosis of the FPGA also can take advantage of its dynamic reconfigurability. We first propose an efficient methodology for testing the interconnects of the FPGA, then present several universal test and diagnosis approaches which cover all functional units of the FPGA. Experimental results show that our approach significantly reduces the testing time, without additional cost for diagnosis.