VLSI Design
Volume 2008 (2008), Article ID 165709, 9 pages
doi:10.1155/2008/165709
Research Article

Antirandom Testing: A Distance-Based Approach

Shen Hui Wu,1 Sridhar Jandhyala,1 Yashwant K. Malaiya,2 and Anura P. Jayasumana1

1Electrical and Computer Engineering Department, Colorado State University, Fort Collins, CO 80523, USA
2Computer Science Department, Colorado State University, Fort Collins, CO 80523, USA

Received 19 March 2007; Accepted 16 January 2008

Academic Editor: Jacob Abraham

Copyright © 2008 Shen Hui Wu et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Shen Hui Wu, Sridhar Jandhyala, Yashwant K. Malaiya, and Anura P. Jayasumana, “Antirandom Testing: A Distance-Based Approach,” VLSI Design, vol. 2008, Article ID 165709, 9 pages, 2008. doi:10.1155/2008/165709