MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing

<table class="table-group" width="800px"><tr class="fig-image" id="a"><td><img alt="91686.fig.013a" src="https://static.hindawi.com/articles/vlsi/volume-2008/291686/figures/91686.fig.013a.jpg"/></td></tr><tr class="fig-caption"><td align="center"><table><tr><td><b>(a) </b>basic active loopback</td></tr></table></td></tr><tr class="fig-image" id="b"><td><img alt="91686.fig.013b" src="https://static.hindawi.com/articles/vlsi/volume-2008/291686/figures/91686.fig.013b.jpg"/></td></tr><tr class="fig-caption"><td align="center"><table><tr><td><b>(b) </b>Advanced active loopback</td></tr></table></td></tr></table>

<table>(a) The basic <i>active</i> loopback configuration and 
(b) active loopback with advanced features.</table>

VLSI Design

fig13

Figure 13

Figure 13: MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing 