Research Article
Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test
Table 2
Compaction, MS, average RPC, and simulation time comparison.
| | Functional fault | Behavioral fault | | model | model |
| Compaction rate | | | Mutation score | | | Relative parametric coverage | 65.6% | 87.8% | Simulation time | 11 h 46 min | 17 h 39 min |
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