]>A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences : Algorithm 2
int serial-search ( 𝑁 , 𝐵 , 𝑉 )
{ int 𝑉 , 𝑁 , 𝐵 , 𝐿 ;
  f o r ( 𝐿 = 1 ; 𝐿 < = 𝑁 − 1 ; 𝐿 + + )
    i f ( 𝐿 ∗ 𝐵 % ( 𝑁 − 1 ) = = 𝑉 ) r e t u r n ( 𝐿 ) ; }
Algorithm 2: Serial-search algorithm.