About this Journal Submit a Manuscript Table of Contents
VLSI Design
Volume 2010 (2010), Article ID 670476, 9 pages
http://dx.doi.org/10.1155/2010/670476
Review Article

Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds?—A Survey

1Department of Electronics and Communication, Nirma University, Ahmedabad 382481, India
2Space Application Center, ISRO, Ahmedabad 380015, India

Received 23 July 2009; Revised 17 November 2009; Accepted 11 January 2010

Academic Editor: Avi Ziv

Copyright © 2010 Usha S. Mehta et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

The run length based coding schemes have been very effective for the test data compression in case of current generation SoCs with a large number of IP cores. The first part of paper presents a survey of the run length based codes. The data compression of any partially specified test data depends upon how the unspecified bits are filled with 1s and 0s. In the second part of the paper, the five different approaches for “don't care” bit filling based on nature of runs are proposed to predict the maximum compression based on entropy. Here the various run length based schemes are compared with maximum data compression limit based on entropy bounds. The actual compressions claimed by the authors are also compared. For various ISCAS circuits, it has been shown that when the X filling is done considering runs of zeros followed by one as well as runs of ones followed by zero (i.e., Extended FDR), it provides the maximum data compression. In third part, it has been shown that the average test power and peak power is minimum when the don't care bits are filled to make the long runs of 0s as well as 1s.