The Impact of Statistical Leakage Models on Design Yield Estimation

<table>Log probability tail plot as function of <svg height="7.1374998" id="M155" style="vertical-align:-0.10033pt" version="1.1" viewbox="0 0 7.8874998 7.1374998" width="7.8874998" xmlns="http://www.w3.org/2000/svg">
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<tspan style="font-size: 12.50px; " x="0" y="0">𝑛</tspan>
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</svg>, <svg height="14.75" id="M156" style="vertical-align:-3.25793pt" version="1.1" viewbox="0 0 42.587502 14.75" width="42.587502" xmlns="http://www.w3.org/2000/svg">
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<g transform="translate(72,-60.2)">
<text transform="matrix(1,0,0,-1,-71.95,63.5)">
<tspan style="font-size: 12.50px; " x="0" y="0">𝜎</tspan>
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<text transform="matrix(1,0,0,-1,-64.61,60.37)">
<tspan style="font-size: 8.75px; " x="0" y="0">𝑧</tspan>
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<text transform="matrix(1,0,0,-1,-56.27,63.5)">
<tspan style="font-size: 12.50px; " x="0" y="0">=</tspan>
<tspan style="font-size: 12.50px; " x="12.027886" y="0">2</tspan>
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</svg> (8 dB). SY and LMM methods show large error in the right tail model.  FW error increases as the number of summands increases.</table>

VLSI Design

The Impact of Statistical Leakage Models on Design Yield Estimation

Figure 10