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VLSI Testing
Guest Editor: Sunil R. Das- Editorial
Volume 1 (1993), Issue 1, Pages i-ii - Guest Editorial, Sunil R. Das
Volume 1 (1993), Issue 1, Pages iii-iv - About the Editor in Chief and the Guest Editor
Volume 1 (1993), Issue 1, Pages v-v - Overlapped Subarray Segmentation: An Efficient Test
Method for Cellular Arrays, Earl E. Swartzlander Jr. and Miroslaw Malek
Volume 1 (1993), Issue 1, Pages 1-7 - Theory, Analysis and Implementation of an On-Line
BIST Technique, Rajiv Sharma and Kewal K. Saluja
Volume 1 (1993), Issue 1, Pages 9-22 - Built-In Self-Test: Milestones and Challenges, Jacob Savir and Paul H. Bardell
Volume 1 (1993), Issue 1, Pages 23-44 - Analysis and Design of Regular Structures for Robust
Dynamic Fault Testability, Michael J. Bryan, Srinivas Devadas, and Kurt Keutzer
Volume 1 (1993), Issue 1, Pages 45-60 - Conditional Disconnection Probability in Star Graphs, Walid Najjar and Pradip K. Srimani
Volume 1 (1993), Issue 1, Pages 61-70 - Coverage of Node Shorts Using Internal Access and
Equivalence Classes, Warren H. Debany Jr.
Volume 1 (1993), Issue 1, Pages 71-85 - Computer-Aided Testing Systems: Evaluation and
Benchmark Circuits, Samiha Mourad
Volume 1 (1993), Issue 1, Pages 87-97