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VLSI Design - Power Supply Circuit Testing
Guest Editor: Rafic Z. Makki- Advancements in Power Supply Current Testing, Rafic Z. Makki
Volume 5 (1997), Issue 3, Pages i-ii - Application of Dynamic Supply Current Monitoring to
Testing Mixed-Signal Circuits
, Mahmoud A. Al-Qutayri and Peter R. Shepherd
Volume 5 (1997), Issue 3, Pages 223-240 - IDDQ Detectable Bridges in Combinational CMOS Circuits, E. Isern and J. Figueras
Volume 5 (1997), Issue 3, Pages 241-252 - IDDQ Testing Experiments for Various CMOS Logic
Design Structures, A. Toukmaji, R. Helms, R. Makki, W. Mikhail, and R. Toole
Volume 5 (1997), Issue 3, Pages 253-271 - Current Testing of CMOS Combinational Circuits with
Single Floating Gate Defects, Victor H. Champac and Joan Figueras
Volume 5 (1997), Issue 3, Pages 273-284 - Operational and Test Performance in the Presence of
Built-in Current Sensors, Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, and Carol Q. Tong
Volume 5 (1997), Issue 3, Pages 285-298 - VLSI Testing for High Reliability: Mixing Testing
With Logic Testing, S. Hwang and R. Rajsuman
Volume 5 (1997), Issue 3, Pages 299-311