Volume 1 [29 articles]

VLSI Testing [10 articles]

• Editorial
  Volume 1 (1993), Issue 1, Pages i-ii
• Guest Editorial, Sunil R. Das
  Volume 1 (1993), Issue 1, Pages iii-iv
• About the Editor in Chief and the Guest Editor
  Volume 1 (1993), Issue 1, Pages v-v
• Overlapped Subarray Segmentation: An Efficient Test Method for Cellular Arrays, Earl E. Swartzlander Jr. and Miroslaw Malek
  Volume 1 (1993), Issue 1, Pages 1-7
• Theory, Analysis and Implementation of an On-Line BIST Technique, Rajiv Sharma and Kewal K. Saluja
  Volume 1 (1993), Issue 1, Pages 9-22
• Built-In Self-Test: Milestones and Challenges, Jacob Savir and Paul H. Bardell
  Volume 1 (1993), Issue 1, Pages 23-44
• Analysis and Design of Regular Structures for Robust Dynamic Fault Testability, Michael J. Bryan, Srinivas Devadas, and Kurt Keutzer
  Volume 1 (1993), Issue 1, Pages 45-60
• Conditional Disconnection Probability in Star Graphs, Walid Najjar and Pradip K. Srimani
  Volume 1 (1993), Issue 1, Pages 61-70
• Coverage of Node Shorts Using Internal Access and Equivalence Classes, Warren H. Debany Jr.
  Volume 1 (1993), Issue 1, Pages 71-85
• Computer-Aided Testing Systems: Evaluation and Benchmark Circuits, Samiha Mourad
  Volume 1 (1993), Issue 1, Pages 87-97