Volume 1 [29 articles]

Digital Hardware Testing [9 articles]

• Special Issue on Digital Hardware Testing, Rochit Rajsuman
  Volume 1 (1994), Issue 4, Pages i-i
• Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS Circuits, M. O. Esonu, D. Al-Khalili, and C. Rozon
  Volume 1 (1994), Issue 4, Pages 261-276
• Resolution Enhancement in I_DDQ Testing for Large ICs, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong, and Sankaran M. Menon
  Volume 1 (1994), Issue 4, Pages 277-284
• Optimal Testing and Design of Adders, Michael J. Batek and John P. Hayes
  Volume 1 (1994), Issue 4, Pages 285-298
• Partial Reset: An Alternative DFT Approach, Ben Mathew and Daniel G. Saab
  Volume 1 (1994), Issue 4, Pages 299-311
• Empirical Bounds on Fault Coverage Loss Due to LFSR Aliasing, Warren H. Debany Jr., Mark J. Gorniak, Anthony R. Macera, Daniel E. Daskiewich, Kevin A. Kwiat, and Heather B. Dussault
  Volume 1 (1994), Issue 4, Pages 313-326
• STD Architecture: A Practical Approach to Test M-Bits Random Access Memories, Rochit Rajsuman and Kamal Rajkanan
  Volume 1 (1994), Issue 4, Pages 327-334
• An Approach for Self-Checking Realization of Interacting Finite State Machines, Fadi Busaba and Parag K. Lala
  Volume 1 (1994), Issue 4, Pages 335-343
• Integrated Test Solutions for a System Design Environment, Kevin T. Kornegay and Robert W. Brodersen
  Volume 1 (1994), Issue 4, Pages 345-357