Volume 5 [32 articles]

VLSI Design - Power Supply Circuit Testing [7 articles]

• Advancements in Power Supply Current Testing, Rafic Z. Makki
  Volume 5 (1997), Issue 3, Pages i-ii
• Application of Dynamic Supply Current Monitoring to Testing Mixed-Signal Circuits, Mahmoud A. Al-Qutayri and Peter R. Shepherd
  Volume 5 (1997), Issue 3, Pages 223-240
• I_DDQ Detectable Bridges in Combinational CMOS Circuits, E. Isern and J. Figueras
  Volume 5 (1997), Issue 3, Pages 241-252
• I_DDQ Testing Experiments for Various CMOS Logic Design Structures, A. Toukmaji, R. Helms, R. Makki, W. Mikhail, and R. Toole
  Volume 5 (1997), Issue 3, Pages 253-271
• Current Testing of CMOS Combinational Circuits with Single Floating Gate Defects, Victor H. Champac and Joan Figueras
  Volume 5 (1997), Issue 3, Pages 273-284
• Operational and Test Performance in the Presence of Built-in Current Sensors, Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, and Carol Q. Tong
  Volume 5 (1997), Issue 3, Pages 285-298
• VLSI Testing for High Reliability: Mixing IDDQ Testing With Logic Testing, S. Hwang and R. Rajsuman
  Volume 5 (1997), Issue 3, Pages 299-311