Advances in Imaging and Spectroscopic Detectors

Call for Papers

Rapid progress in x-ray detectors in the last few years is enabling a wide range of new applications. Important recent developments have occurred in superconducting detectors, thin-film arrays, imaging, and spectroscopic detectors. In many cases, detector advances underway for one application will prove to have significant benefit in many different areas. X-Ray Optics and Instrumentation provides a common venue for researchers in myriad applications, including astronomy, material science, plasma physics, medical instruments, synchrotron applications, solid-state physics, and mineralogy, to encourage a broad perspective and cross-fertilization.

Submission on x-ray and neutron detectors are solicited for topics including, but not limited to:

  • Superconducting arrays
  • Thin-film transistors (TFTs)
  • Charge-coupled and charge-injection devices
  • Amorphous array detectors
  • High Z semiconductors (e.g., CdTe, HgI2, CZT)
  • Drift detectors
  • Single-carrier detector designs
  • Microcalorimeters
  • Microchannel plates (MCPs)
  • Gas electron multipliers (GEMs)
  • Gas microstrip detectors (GMDs)
  • Avalanche photodiodes (APDs)

Authors should follow the X-Ray Optics and Instrumentation manuscript format described at http://www.hindawi.com/journals/xroi/. Prospective authors should submit an electronic copy of their complete manuscript through the journal Manuscript Tracking System at http://mts.hindawi.com/, according to the following timetable:

Manuscript DueMarch 1, 2009
First Round of ReviewsJune 1, 2009
Publication DateSeptember 1, 2009

Guest Editors

  • Patrick Doty, Sandia National Laboratories, P.O. Box 696, Livermore, CA 94551-9402, USA
  • J. Scott Price, GE Global Research, Niskayuna, NY 12309, USA