Felice Crupi received the M.S. degree in electronic engineering from the University of Messina, Messina, Italy, in 1997 and the Ph.D. degree from the University of Firenze, Firenze, Italy, in 2001. Since 2002, he has been with the Dipartimento di Elettronica, Informatica e Sistemistica, Università della Calabria, Rende, Italy, as an Associate Professor of electronics. Since 1998, he has been a repeat Visiting Scientist with the Interuniversity Microelectronics Center (IMEC), Leuven, Belgium. In 2000, he was a Visiting Scientist with the IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA. His main research interests include reliability of CMOS devices, electrical characterization techniques for solid state electronic devices, modeling and simulation of CMOS devices, the design of ultralow noise electronic instrumentation, and the design of extremely low power CMOS circuits. He has authored and coauthored more than 70 papers published in peer-reviewed journals and more than 50 papers published in international conference proceedings. His publications have been cited more than 700 times and his h-index is equal to 15 (Scopus’s source). He served as a Technical Program Committee Member of the IEEE International Electron Devices Meeting (IEDM) and the IEEE International Reliability Physics Symposium (IRPS). He has been the coordinator of international research projects in the field of semiconductor devices and circuits.
Biography Updated on 26 August 2012