Research Article

Photoconductive Properties of Brush Plated Copper Indium Gallium Selenide Films

Table 2

Microstructural parameters of films of different composition.

Composition ( )Thickness (nm)Lattice parameter (Å)Grain size (nm)Strain ( )Dislocation density ( )

0.95005.62311.115302.511.11
0.86605.64511.160392.450.66
0.77105.66211.235452.240.49
0.68055.68211.275492.120.42
0.59005.69311.330521.870.37
0.410355.71311.395571.480.31
0.311875.72311.450621.120.26
0.213085.74811.507661.020.23
0.115005.76511.558700.910.20