Simple and Rapid Fabrication of Thin Films by a Chelate Route
Figure 2
XRD spectra of the thin films grown using (a) 20 mol %, (b) 10 mol% Na+ excess, (c) 0 mol% alkaline excess, and (d) 15 mol% K+ excess in precursor solutions on Pt/TiO2/SiO2/Si substrate after annealing at 600–750°C.
