Research Article

Spring Deformation Gauge for Measuring Local Deformations in Triaxial Apparatus

Table 5

Resolution of the various devices used during the K0 test.

DeviceAxial SDGRadial SDGExternal LVDTExternal volume change unit

Resolution0.2 μm0.075 μm0.75 μm1 mm3
εa resolution (%)1.0 × 10−34.0 × 10−3
εr resolution (%)1.0 × 10−3
εv resolution (%)1.0 × 10−4